Challenge: Semiconductor wafer inspection utilizes ellipsometry as part of the metrology processes to evaluate nanoscale tolerances for thin film coating thickness consistency and flatness that are critical for these manufacturers.
Design Solution: Diffraction Gratings are used in these laser-based systems which deliver the light configuration necessary in these processing lines.
Business Impact: Sourcing this precision optic with an experienced, reliable and trusted US-based manufacturer guarantees the highest quality, superb repeatability with a stable supplier.